Apr 21, 2024  
General Catalog 2023-2024 
    
General Catalog 2023-2024
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ECE 242 - Digital Systems Testing and Testable Design


Introduction to VLSI testing, VLSI test process and automatic test equipment, test economic, faults and fault modeling, logic and fault simulation, testability measures, delay test, design for testability, built-in self-test, boundary scan, and JTAG.

Units: 3

Course Typically Offered:



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